Special issue on electron and optical beam testing of electronic devices - proceedings of the fifth European Conference on Electron and Optical Beam Testing of Electronic Devices, August 27-30, 1995, Wuppertal, Germany

Författare
L. J. Balk B. Courtois E. Wolfgang European Conference on Electron and Optical Beam Testing of Electronic Devices 1995 : Wuppertal)
(Edited by: E. Wolfgang, B. Courtois, L.J. Balk.)
Genre
Konferenser, Ej skönlitteratur, Konferenspublikation
Språk
Engelska
Förlag År Ort Om boken ISBN
Elsevier 1996 Nederländerna, Amsterdam 432 sidor. ill.